journal:2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Authors:Dominik Schneider; Bernhard Liebhart; Christian Endisch
Published date:2021-5-17
DOI:10.1109/i2mtc50364.2021.9459790
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9459790
Article link:http://dx.doi.org/10.1109/i2mtc50364.2021.9459790
Article Source:IEEE。
Remark: